
Text extracted from the exhibit documents filed with the FCC. Open a document above to read the original.
Aeon Labs LLC. Date: Aug 26, 2013 Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: XBADSC25 Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Exhibit Type File Name Schematics Block Diagram Operational Description SCH.pdf BlockDiagram.pdf CircuitDescription.pdf The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Aeon Labs LLC. ---------------------------------- William Li / Director of Business Development
Aeon Labs LLC. FCC ID: XBADSC25 POWER OF ATTORNEY Aug 26, 2013 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf shall have the same effect as acts of our own. This authorization expires on Aug 25,2014. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, Aeon Labs LLC., are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, Aeon Labs LLC. ---------------------------------- William Li / Director of Business Development
Report No.: WTS13S0806295E Page 22 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 11 Photographs - Constructional Details 11.1 EUT - Appearance View Report No.: WTS13S0806295E Page 23 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Report No.: WTS13S0806295E Page 24 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn
FCC Label FCC Label Sample for model: DSC25-ZWUS The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable. Aeon Labs LLC. Model No.: DSC25-ZWUS FCC ID: XBADSC25 DC120V by battery This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause harmful interference, and (2) this device must accept any Interference received, including interference that may cause undesired operation.
FCC Label FCC Label Sample for model: DSC25-ZWUS FCC ID: XBADSC25 This device complies with Part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) this device may not cause interference, and this device must accept any interference, including interference that may cause undesired operation of the device. (2) The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable.
Report No.: WTS13S0806295E Page 25 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 11.2 EUT - Open View Report No.: WTS13S0806295E Page 26 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn ANT Report No.: WTS13S0806295E Page 27 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 11.3 EUT – RF Module Report No.: WTS13S0806295E Page 28 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn ==END==
Report No.: WTS13S0806295E Page 1 of 28 TEST REPORT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn FCC ID : XBADSC25 Applicant : Aeon Labs LLC. Address : 121 Buckingham DriveˈUnit 36ˈSanta ClarasˈCaliforniaˈUnited Statesˈ95051 Manufacturer : The same as above Address : The same as above Equipment Under Test (EUT) : Product Name : Smart Dimmer (2nd Edition) Model No. : DSC25-ZWUS Rules : FCC CFR47 Part 15 Section 15.249: 2012 Date of Test : August 10~11, 2013 Date of Issue : August 26, 2013 Test Result : PASS* Remark: * The sample described above has been tested to be in compliance with the requirements of the rules listed above. The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. PERPARED BY: Waltek Services (Shenzhen) Co., Ltd. 1/F, Fukangtai Building, West of Baima Road., Songgang Street, Bao’an District, Shenzhen, China Tel: +86-755-83551033 Fax: +86-755-83552400 Compiled by: Approved by: Maikou Zhang Maikou Zhang / Project Engineer Philo Zhong / Manager Report No.: WTS13S0806295E Page 2 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Test Summary Test Items Test Requirement Result Restricted Band 15.205 N/A Conducted Emissions 15.207 PASS Radiated Emission 15.205(a) 15.209 15.249(a) PASS Antenna Requirement 15.203 PASS Report No.: WTS13S0806295E Page 3 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1COVER PAGE ............................................................................................................................................1 2 TEST SUMMARY .................................................................................................................................................... 2 3CONTENTS .............................................................................................................................................................. 3 4GENERAL INFORMATION ................................................................................................................................... 4 4.1G ENERALDESCRIPTION OF E.U.T. ............................................................................................................. 4 4.2D ETAILS OF E.U.T........................................................................................................................................ 4 4.3T ESTFACILITY .............................................................................................................................................. 4 4.4T ESTLOCATION ............................................................................................................................................ 4 4.5G ENERAL CONDITION ................................................................................................................................... 5 4.5.1Environmental condition of test site ........................................................................................................ 5 4.5.2Test Mode ................................................................................................................................................... 5 5EQUIPMENT USED DURING TEST .................................................................................................................... 6 5.1E QUIPMENTS LIST ........................................................................................................................................ 6 5.2M EASUREMENTUNCERTAINTY .................................................................................................................... 6 5.3T ESTEQUIPMENT CALIBRATION .................................................................................................................. 6 6CONDUCTED EMISSION TEST ........................................................................................................................... 7 6.1E.U.T. T ESTCONDITION .............................................................................................................................. 7 6.2EUT S ETUP .................................................................................................................................................. 7 6.3C ONDUCTEDEMISSION TESTRESULT ......................................................................................................... 8 7RADIATION EMISSION TEST ............................................................................................................................ 10 7.1EUT O PERATION: ...................................................................................................................................... 10 7.2T ESTSETUP ............................................................................................................................................... 11 7.3S PECTRUMANALYZER SETUP ................................................................................................................... 12 7.4T ESTPROCEDURE ..................................................................................................................................... 13 7.5C ORRECTEDAMPLITUDE&MARGIN CALCULATION .................................................................................. 13 7.6R ADIATEDEMISSIONS TESTRESULT ......................................................................................................... 13 7.7R ADIATEDEMISSION DATA ........................................................................................................................ 14 8RESTRICTED BAND ............................................................................................................................................ 18 9ANTENNA REQUIREMENT .........................................…
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Report No.: WTS13S0806295E Page 20 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 10 Photographs of Testing 10.1 Conducted Emissions Test View 10.2 Radiation Emission From 30MHz-1GHz Report No.: WTS13S0806295E Page 21 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 10.3 Radiation Emission From 30MHz-1GHz 10.4 Radiation Emission Above 1GHz Report No.: WTS13S0806295E Page 22 of 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 11 Photographs - Constructional Details 11.1 EUT - Appearance View
| # | Rule Parts | Frequency Range | Power Output |
|---|---|---|---|
| 1 | 15C | 908.42 MHz - 908.42 MHz | - |

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DSC17103-ZWUS,DSC14104-ZWUS
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