XBASH001Power Supply for SONTE Film

Aeon Labs LLC. Date: March 24, 2014 Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: XBASH001. Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Exhibit Type File Name Schematics Block Diagram Operational Description SCH.pdf BlockDiagram.pdf CircuitDescription.pdf The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Aeon Labs LLC. ................................................ Signature William Li/Director of Business Development ................................................

Aeon Labs LLC. FCC ID: XBASH001 POWER OF ATTORNEY Date: March 24,2014 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf shall have the same effect as acts of our own. This authorization expires on January 12,2015. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, Aeon Labs LLC. are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, Aeon Labs LLC. ................................................................................. Signature William Li/Director of Business Development .................................................................................

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn SH001 - Photographs - C onstructional Details EUT – External View Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

FCC Label Location for model: SH001 The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable. FCC ID: XBASH001 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

FCC Label Sample for model: SH001 FCC ID: XBASH001 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn S H001 - Internal View Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn ANT RF module Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Page 1 of 50 TEST REPORT Reference No. .................... : WTS14S0312322E FCC ID................................. : XBASH001 Applicant ............................ : Aeon Labs LLC. Address .............................. : 121 Buckingham Drive Unit 36 Santa Claras California United States Manufacturer ..................... : Aeon Labs LLC. Address .............................. : 121 Buckingham Drive Unit 36 Santa Claras California United States Product Name .................... : Power Supply for SONTE Film Model No. ........................... : SH001 Trademark .......................... : SONTE Standards ........................... : FCC CFR47 Part 15 C Section 15.247:2012 Date of Receipt sample ..... : Mar.21, 2014 Date of Test ........................ : Mar.26-Apr.11, 2014 Date of Issue ...................... : Apr.28, 2014 Test Result ......................... : Pass * *Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Testing location: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by: Approved by: Zero Zhou / Project Engineer Philo Zhong / Manager Reference No.: WTS14S0312322E Page 2 of 50 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Test Summary Test Items Test Requirement Result Radiated Emissions 15.247 15.205(a) 15.209(a) PASS Conducted Emissions 15.207(a) PASS 6dB Bandwidth 15.247(a)(2) PASS Maximum Peak Output Power 15.247(b)(3),(4) PASS Power Spectral Density 15.247(e) PASS Band Edge 15.247(d) PASS Antenna Requirement 15.203 PASS Maximum Permissible Exposure (Exposure of Humans to RF Fields) 1.1307(b)(1) PASS Reference No.: WTS14S0312322E Page 3 of 50 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 TEST SUMMARY ................................................................................................................................................ 2 3 CONTENTS .......................................................................................................................................................... 3 4 GENERAL INFORMATION ................................................................................................................................ 5 4.1 GENERAL DESCRIPTION OF E.U.T. .............................................................................................................. 5 4.2 DETAILS OF E.U.T. ....................................................................................................................................... 5 4.3 TEST MODE ................................................................................................................................................... 5 4.4 TEST FACILITY ............................................................................................................................................... 6 5 EQUIPMENT USED DURING TEST ................................................................................................................ 7 5.1 EQUIPMENTS LIST ......................................................................................................................................... 7 5.2 MEASUREMENT UNCERTAINTY ..................................................................................................................... 7 5.3 TEST EQUIPMENT CALIBRATION ................................................................................................................... 7 6 CONDUCTED EMISSION .................................................................................................................................. 8 6.1 E.U.T. OPERATION ....................................................................................................................................... 8 6.2 EUT SETUP ................................................................................................................................................... 8 6.3 CONDUCTED EMISSION TEST RESULT ......................................................................................................... 9 7 RADIATED EMISSIONS................................................................................................................................... 11 7.1 EUT OPERATION : ....................................................................................................................................... 11 7.2 TEST SETUP ................................................................................................................................................ 12 7.3 SPECTRUM ANALYZER SETUP .................................................................................................................... 13 7.4 TEST PROCEDURE ...................................................................................................................................... 14 7.5 CORRECTED AMPLITUDE & MARGIN CALCULATION ................................................................................... 14 7.6 SUMMARY OF TEST RESULTS ..................................................................................................................... 15 8 BAND EDGE MEASUREMENT ...................................................................................................................... 21 8.1 TEST PRODUCE ........…

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Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn SH001 - Photographs - Test Setup Conducted Emission Radiated Emission Test frequency below 30MHz Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Test freq uency from 30MHz to 1GHz Test frequency above 1GHz