XBAZW089RECESSED DOOR SENSOR GEN5

Aeon Labs LLC. Date: May 12, 2014 Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: XBAZW089 Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Exhibit Type File Name Schematics Block Diagram Operational Description SCH.pdf BlockDiagram.pdf CircuitDescription.pdf The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. The applicant understands that pursuant to Section 0.457 of the Rules, disclosure of this application and all accompanying documentation will not be made before the date of the Grant for this application. Sincerely, Aeon Labs LLC. ................................................ Signature William Li/Director of Business Development ................................................

Aeon Labs LLC. FCC ID: XBAZW089 POWER OF ATTORNEY Date: May 12,2014 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 To Whom It May Concern: We, the undersigned, hereby authorize Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf, to apply to the Federal Communications Commission on our equipment. Any and all acts carried out by Waltek Services (ShenZhen) Co., Ltd. (Philo Zhong) on our behalf shall have the same effect as acts of our own. This authorization expires on May 11,2015. This is to advise that we are in full compliance with the Anti-Drug Abuse Act. We, Aeon Labs LLC. are not subject to a denial of federal benefits pursuant to Section 5301 of the Anti-Drug Act of 1988, 21 USC853a, and no party to the application is subject to a denial of federal benefits pursuant to that section. Sincerely, Aeon Labs LLC. ................................................................................. Signature William Li/Director of Business Development .................................................................................

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs - Constructional Details Model ZW089-A - External View Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

FCC Label Location for model: ZW089-A The Label must not be a stick-on paper. The Label on these products must be permanently affixed to the product and readily visible at the time of purchase and must last the expected lifetime of the equipment not be readily detachable. FCC ID: XBAZW089 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received,including interference that may cause undesired operation.

FCC Label Sample for model: ZW089-A FCC ID: XBAZW089 This device complies with part 15 of the FCC Rules. Operation is subject to the following two conditions: (1) This device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation.

Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Model ZW089-A - Internal View Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn PCB printed ANT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn RF Module View Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

TEST REPORT Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Page 1 of 25 Reference No. .................... : WTS14S0413565E FCC ID ................................ : XBAZW089 Applicant ............................ : Aeon Labs LLC. Address .............................. : 1228 NORVELL ST.EL CERRITO, CA 94530 USA Manufacturer .................... : The same as above. Address .............................. : The same as above. Product Name .................... : Recessed Door Sensor Gen5 Model No. ........................... : ZW089-A Trademark .......................... : AEON LABS/AEOTEC Standards .......................... : FCC CFR47 Part 15 Section 15.249: 2012 Date of Receipt sample .... : Apr.30, 2014 Date of Test ....................... : May 04-05, 2014 Date of Issue ...................... : May 28, 2014 Test Result ......................... : Pass * *Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Testing location: The same as above Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by: Approved by: Zero Zhou / Project Engineer Philo Zhong / Manager Reference No.: WTS14S0413565E Page 2 of 25 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 2 Test Summary Test Items Test Requirement Result Conducted Emissions 15.207 N/A Radiated Emission 15.249(a) 15.209 15.205(a) PASS Periodic Operation 15.35(c) PASS Outside of Band Emission 15.249 15.205 15.209 PASS 20dB Bandwidth 15:215(c) PASS Antenna Requirement 15.203 PASS Reference No.: WTS14S0413565E Page 3 of 25 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn 3 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 TEST SUMMARY .................................................................................................................................................. 2 3 CONTENTS ............................................................................................................................................................ 3 4 GENERAL INFORMATION .................................................................................................................................. 4 4.1 GENERAL DESCRIPTION OF E.U.T. ............................................................................................................ 4 4.2 DETAILS OF E.U.T. ..................................................................................................................................... 4 4.3 TEST FACILITY ............................................................................................................................................ 4 4.4 TEST MODE ................................................................................................................................................ 4 5 EQUIPMENT USED DURING TEST .................................................................................................................. 5 5.1 EQUIPMENTS LIST ...................................................................................................................................... 5 5.2 MEASUREMENT UNCERTAINTY ................................................................................................................... 5 5.3 TEST EQUIPMENT CALIBRATION................................................................................................................. 5 6 CONDUCTED EMISSION .................................................................................................................................... 6 7 RADIATION EMISSION TEST ............................................................................................................................ 7 7.1 EUT OPERATION ........................................................................................................................................ 7 7.2 TEST SETUP ............................................................................................................................................... 8 7.3 SPECTRUM ANALYZER SETUP .................................................................................................................... 9 7.4 TEST PROCEDURE .................................................................................................................................... 10 7.5 CORRECTED AMPLITUDE & MARGIN CALCULATION ................................................................................ 10 7.6 TEST RESULT ........................................................................................................................................... 11 8 PERIODIC OPERATION .................................................................................................................................... 13 9 OUTSIDE OF BAND EMISSION ....................................................................................................................... 14 9.1 TEST PROCEDURE .................................................................................................................................... 14 9.2 TEST RESULT ........................................................................................................................................... 14 10 20 DB BANDWIDTH MEASUREMENT ........................................................................................................... 16 10.1 TEST PROCEDURE ....................................................................................................................................…

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Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Photographs- Model ZW089-A Test Setup Radiation Emission From 30MHz -1GHz Radiation Emission Above 1GHz