XS8-CONV3XFULL2way Keyboard USB wired connection and Bluetooth wireless connection

DIATEC CORPORATION 4F Kairaku Bldg. (Soto-kanda), 6-5-4, Sotokanda, Chiyoda-ku, Tokyo, 101-0021 Attestation Statement Letter I Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 USA Date: April 15, 2024 Ref: Attestation Statements Part 2.911(d)(5)(i) Filing FCC Application for FCC ID: XS8-CONV3XFULL DIATEC CORPORATION certifies that the equipment for which authorization is sought is not “covered” equipment prohibited for receiving an equipment authorization pursuant to section 2.903 of the FCC rules. Sincerely, Applicant’s Signature: Applicant’s Name: Yuko Tomiyoshi

DIATEC CORPORATION 4F Kairaku Bldg. (Soto-kanda), 6-5-4, Sotokanda, Chiyoda-ku, Tokyo, 101-0021 Attestation Statement Letter II Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 USA Date: April 15, 2024 Ref: Attestation Statements Part 2.911(d)(5)(ii) Filing FCC Application for FCC ID: XS8-CONV3XFULL DIATEC CORPORATION certifies that, as of the date of the filing of the application, the applicant is not identified on the Covered List as an entity producing “covered” equipment. Sincerely, Applicant’s Signature: Applicant’s Name: Yuko Tomiyoshi

Date: April 15, 2024 Federal Communications Commission Authorization and Evaluation Division 7435 Oakland Mills Road Columbia, MD 21046 FCC ID: XS8-CONV3XFULL US Agent – Attestatifon Statement / Part 2.911(d)(7) DIATEC CORPORATION certifies, that as of April 15, 2024, we have designated Mechanical Keyboards, LLC to be our U.S. agent for service on our behalf for FCC ID: XS8-CONV3XFULL DIATEC CORPORATION, accepts to maintain an agent of service of process in the United States for no less than one year after either the grantee has permanently terminated all marketing and importation of the applicable equipment within the U.S., or the conclusion of any Commission- related administrative or judicial proceeding involving the equipment, whichever is later. Mechanical Keyboards, LLC, accepts as of the date of the filing of this application, the obligation of being the designated agent for the purpose of accepting service of process on behalf of DIATEC CORPORATION for FCC ID: XS8-CONV3XFULL Designated Agent Information: Company Name: Mechanical Keyboards, LLC FRN: 0024287492 Address: 7118 Loblolly Pine Blvd. Fairview, TN 37062-8376, USA Contact Person: Joel Tubre Phone: (615) 266-1420 Email: [email protected] Sincerely, Company: DIATEC CORPORATION Designated Agent: Mechanical Keyboards, LLC Company Representative: Yuko Tomiyoshi Designated Agent Representative: Joel Tubre Signature: Signature:

Date: 12/18/2019 VCB_F-01: Operating Procedures Form – FCC Confidentiality v03 Page 1 of 1 DIATEC CORPORATION Federal Communications Commission Authorization and Evaluation Division Confidentiality Request regarding application for certification of FCC ID: XS8- CONV3XFULL Pursuant to Sections 0.457 and 0.459 of the Commission’s Rules, we hereby request confidential treatment of information accompanying this application as outlined below: Type of Confidentiality Requested Exhibit Type ☐Short Term ☐ Permanent Block Diagrams ☐Short Term External Photos ☐Short Term ☐Permanent* Internal Photos ☐Short Term ☐Permanent Operation Description ☐Short Term ☐Permanent Parts List/BOM ☐Short Term ☐Permanent Schematics ☐Short Term Test Setup Photos ☐ Short Term ☐Permanent* User manual *Requires further justification before permanent confidentiality will be allowed. The above materials contain trade secrets and proprietary information not customarily released to the public. The public disclosure of these materials may be harmful to the applicant and provide unjustified benefits to its competitors. Permanent Confidentiality: The applicant requests the exhibits listed above as permanently confidential be withheld from public review due to materials that contain trade secrets and proprietary information not customarily released to the public. Short-Term Confidentiality: Pursuant to DA04-1705 June 15, 2004 of the Commission’s public notice, we also request temporary confidential treatment of information accompanying this application as outlined below for an initial period of 90 days. Sincerely, Client’s signature: Client’s name & title: Yuko Tomiyoshi (Managing Director) Contact information / address: 4F Kairaku Bldg. (Soto-kanda), 6-5-4, Sotokanda, Chiyoda-ku, Tokyo, 101-0021

Made in Taiwan Change CapsLock & left Ctrl Model No. FILCKFBT3-33X Serial No. Part No. R-R-FKB-FILCKFBT2 -33X DIATEC Corporation Majestouch Convertible 3X SW3 SW4 SW2 SW1 DIP 106KR104EN105EU Change Esc & [ ` ~] Change Esc & [ ` ¦ ¬] top: side:right Fn top:right side: Fn Invalidate & CMIIT ID : 24J315K1G151FCC ID : XS8-CONV3XFULL

Korea Standard Testlab 107-25, Jangdeokdong-gil, Namyang-eup, Hwaseong-si, Gyeonggi-do, Korea Tel : +82-31-356-7333 FAX : +82-31-356-7303 Report Number : KST-N-230217 Page 2/67 The test results presented in this report apply only to the specific sample(s) tested and described in the report itself. This Report shall not be reproduced partially or in its entirety without the written approval of KST KSTFR-P30-09(Rev.3.0) TABLE OF CONTENTS 1. General Information·························································································································4 1.1. Client Information······················································································································4 1.2. General Description of E.U.T.····································································································4 1.3. Details of E.U.T.························································································································4 1.4. Test Facility·······························································································································5 2. Test Equipment and Ancillaries used for Tests··················································································6 3. Summary of Test Results··················································································································7 4. Test Results······································································································································8 4.1. E.U.T. test conditions·················································································································8 4.1.1. EUT channels and frequencies list························································································9 4.1.2. Test Mode····························································································································9 4.2. Antenna ···································································································································10 4.2.1. Requirement·······················································································································10 4.2.2. Test Result·························································································································10 4.3. 20dB Bandwidth·······················································································································11 4.3.1. Requirement & Test method·······························································································11 4.3.2. Test Configuration·············································································································11 4.3.3. Test Procedure···················································································································11 4.3.4. Test result··························································································································12 4.4. Channel Separation···················································································································14 4.4.1. Requirement & Test method·······························································································14 4.4.2. Test Configuration·············································································································14 4.4.3. Test Procedure···················································································································14 4.4.4. Test result··························································································································15 4.5. Conducted Maximum Output Power·························································································17 4.5.1. Requirement & Test Method·······························································································17 4.5.2. Test Configuration·············································································································17 4.5.3. Test Procedure···················································································································17 4.5.4. Test result··························································································································18 4.6. Band Edge································································································································20 4.6.1. Requirement & Test method·······························································································20 4.6.2. Test Configuration·············································································································20 4.6.3. Test Procedure···················································································································20 4.6.4. Test result··························································································································20 4.7. Radiated Band Edge·················································································································22 4.7.1. Requirement & Test method·······························································································22 4.7.2. Test Configuration·············································································································22 Korea Standard Testlab 107-25, Jangdeokdong-gil, Namyang-eup, Hwaseong-si, Gyeonggi-do, Korea Tel : +82-31-356-7333 FAX : +82-31-356-7303 Report Number : KST-N-230217 Page 3/67 The test results presented in this report apply only to the specific sample(s) tested and described in the report itself. This Report shall not be reproduced partially or in its entirety without the written approval of KST KSTFR-P30-09(Rev.3.0)…

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Korea Standard Testlab 107-25, Jangdeokdong-gil, Namyang-eup, Hwaseong-si, Gyeonggi-do, Korea Tel : +82-31-356-7333 FAX : +82-31-356-7303 Report Number : KST-N-230217 Page 2/67 The test results presented in this report apply only to the specific sample(s) tested and described in the report itself. This Report shall not be reproduced partially or in its entirety without the written approval of KST KSTFR-P30-09(Rev.3.0) TABLE OF CONTENTS 1. General Information·························································································································4 1.1. Client Information······················································································································4 1.2. General Description of E.U.T.····································································································4 1.3. Details of E.U.T.························································································································4 1.4. Test Facility·······························································································································5 2. Test Equipment and Ancillaries used for Tests··················································································6 3. Summary of Test Results··················································································································7 4. Test Results······································································································································8 4.1. E.U.T. test conditions·················································································································8 4.1.1. EUT channels and frequencies list························································································9 4.1.2. Test Mode····························································································································9 4.2. Antenna ···································································································································10 4.2.1. Requirement·······················································································································10 4.2.2. Test Result·························································································································10 4.3. 20dB Bandwidth·······················································································································11 4.3.1. Requirement & Test method·······························································································11 4.3.2. Test Configuration·············································································································11 4.3.3. Test Procedure···················································································································11 4.3.4. Test result··························································································································12 4.4. Channel Separation···················································································································14 4.4.1. Requirement & Test method·······························································································14 4.4.2. Test Configuration·············································································································14 4.4.3. Test Procedure···················································································································14 4.4.4. Test result··························································································································15 4.5. Conducted Maximum Output Power·························································································17 4.5.1. Requirement & Test Method·······························································································17 4.5.2. Test Configuration·············································································································17 4.5.3. Test Procedure···················································································································17 4.5.4. Test result··························································································································18 4.6. Band Edge································································································································20 4.6.1. Requirement & Test method·······························································································20 4.6.2. Test Configuration·············································································································20 4.6.3. Test Procedure···················································································································20 4.6.4. Test result··························································································································20 4.7. Radiated Band Edge·················································································································22 4.7.1. Requirement & Test method·······························································································22 4.7.2. Test Configuration·············································································································22 Korea Standard Testlab 107-25, Jangdeokdong-gil, Namyang-eup, Hwaseong-si, Gyeonggi-do, Korea Tel : +82-31-356-7333 FAX : +82-31-356-7303 Report Number : KST-N-230217 Page 3/67 The test results presented in this report apply only to the specific sample(s) tested and described in the report itself. This Report shall not be reproduced partially or in its entirety without the written approval of KST KSTFR-P30-09(Rev.3.0)…

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