QISSCL-L04Smart Phone

Huawei Technologies Co.,Ltd. Federal Communications Commission 2015-8 -28 7435 Oakland Mills Road Columbia MD 21046 S ubject: Request for Confidentiality FCC ID: QISSCL- L04 To Whom It May Concern: Pursuant to the provisions of Sections 0.457 and 0.459 of the Commission’s rules (47 CFR §§ 0.457, 0.459), we are requesting the Commission to withhold the following attachments as c onfidential document from public disclosure indefinitely. Schematic Diagram Block Diagram Operational Description Bom List Tune-Up Procedure Above mentioned document contains detailed system and equipment description are considered as proprietary information in operation of the equipment. The public disclosure of above documents might be harmful to our company and would give competitor an unfair advantage in the market. ***************************************************************************** In additional to above mentioned documents, pursuant to Public Notice DA 04-1705 of the Commission’s policy, in order to comply with the marketing regulations in 47 CFR §2.803 and the importation rules in 47 CFR §2.1204, while ensuring that business sensitive information remains confidential until the actual marketing of newly authorized devices. We are requesting the Commission withholds the following documents from public viewing until 201 5-12-20: External Photos Internal Photos Test Setup Photos User Manual ****************************************************************************** It is our understanding that all measurement test reports, FCC ID label format and correspondent during certification review process cannot be granted as confidential documents and those information will be available for public review once the grant of equipment authorization is issued. Best Regards Zhang Xinghai EMC Laboratory Manager Huawei Technologies Co., Ltd. E-mail: [email protected] Fax: 0086-0755-89650226

Huawei Technologies Co.,Ltd Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District,Shenzhen,518129,P.R.C Tel: 0086 -0755-28970299 ; F ax: 0086-0755-89650226 Date: August 28, 2015 Statement We, Huawei Technologies Co.,Ltd, states that our device, FCC ID: QISSCL- L04, has a battery, But the battery will be placed in the battery compartment when delivery, it is not visible to the users as they purchase the products. For and Behalf of: Huawei Technologies Co., Ltd. Zhang Xinghai EMC Laboratory Manager

HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 8/28/2015 Page1,Total 2 External Photos of HUAWEI SCL-L04, SCL-L04 HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 8/28/2015 Page2,Total 2

HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-8-28 Page1, Total2 Label & Label Location： HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-8-28 Page2, Total2

HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-08-28 Page1, Total6 Internal Photos of HUAWEI SCL-L04, SCL-L04 HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-08-28 Page2, Total6 HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-08-28 Page3, Total6 HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-08-28 Page4, Total6 HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-08-28 Page5, Total6 HUAWEI SCL-L04, SCL-L04 Smart Phone SECRET 2015-08-28 Page6, Total6

No. I15Z41883-SEM01 Page 111 of 231 ©Copyright. All rights reserved by CTTL. Fig.14-1 Z-Scan at power reference point (Band 4 CH20050) No. I15Z41883-SEM01 Page 112 of 231 ©Copyright. All rights reserved by CTTL. LTE Band 5 Left Cheek Low with QPSK_10MHz_1RB_ Low Date/Time: 2015/7/21 Electronics: DAE4 Sn786 Medium: Head 850 MHz Medium parameters used (interpolated): f = 829 MHz; σ = 0.923 S/m; ε r = 41.402; ρ = 1000 kg/m 3 Ambient Temperature:22.0 o C Liquid Temperature:21.5 o C Communication System: LTE_FDD Frequency: 829 MHz Duty Cycle: 1:1 Probe: ES3DV3 - SN3151 ConvF(6.04, 6.04, 6.04); Left Cheek Low_1RB_Low/Area Scan (41x81x1): Interpolated grid: dx=1.500 mm, dy=1.500 mm Maximum value of SAR (interpolated) = 0.203 W/kg Left Cheek Low_1RB_Low/Zoom Scan (7x7x7)/Cube 0: Measurement grid: dx=5mm, dy=5mm, dz=5mm Reference Value = 7.634 V/m; Power Drift = 0.18 dB Peak SAR (extrapolated) = 0.265 W/kg SAR(1 g) = 0.196 W/kg; SAR(10 g) = 0.143 W/kg Maximum value of SAR (measured) = 0.205 W/kg Fig.15 LTE Band 5 CH20450 No. I15Z41883-SEM01 Page 113 of 231 ©Copyright. All rights reserved by CTTL. Fig.15-1 Z-Scan at power reference point (Band 5 CH20450) No. I15Z41883-SEM01 Page 114 of 231 ©Copyright. All rights reserved by CTTL. LTE Band 5 Body Rear Low with QPSK_10MHz_1RB_ Low Date/Time: 2015/8/8 Electronics: DAE4 Sn786 Medium: Body850 MHz Medium parameters used (interpolated): f = 829 MHz; σ = 0.964 S/m; ε r = 53.537; ρ = 1000 kg/m 3 Ambient Temperature:22.0 o C Liquid Temperature:21.5 o C Communication System: LTE_FDD Frequency: 829 MHz Duty Cycle: 1:1 Probe: ES3DV3 - SN3151 ConvF(6.14, 6.14, 6.14); Rear side low_1RB_Low/Area Scan (41x81x1): Interpolated grid: dx=1.500 mm, dy=1.500 mm Maximum value of SAR (interpolated) = 0.360 W/kg Rear side low_1RB_Low/Zoom Scan (7x7x7)/Cube 0: Measurement grid: dx=5mm, dy=5mm, dz=5mm Reference Value = 19.456 V/m; Power Drift = -0.02 dB Peak SAR (extrapolated) = 0.406 W/kg SAR(1 g) = 0.336 W/kg; SAR(10 g) = 0.260 W/kg Maximum value of SAR (measured) = 0.352 W/kg Fig.16 LTE Band 5 CH20450 No. I15Z41883-SEM01 Page 115 of 231 ©Copyright. All rights reserved by CTTL. Fig.16-1 Z-Scan at power reference point (Band 5 CH20450) No. I15Z41883-SEM01 Page 116 of 231 ©Copyright. All rights reserved by CTTL. LTE Band 7 Right Cheek High with QPSK_20MHz_1RB_ High Date/Time: 2015/8/1 Electronics: DAE4 Sn786 Medium: Head 2600 Medium parameters used: f = 2560 MHz; σ = 2.000 S/m; ε r = 38.93; ρ = 1000 kg/m 3 Ambient Temperature:22.0 o C Liquid Temperature:21.5 o C Communication System: LTE_FDD Frequency: 2560 MHz Duty Cycle: 1:1 Probe: ES3DV3 - SN3151 ConvF(4.57, 4.57, 4.57); Right Cheek High_1RB_High/Area Scan (51x81x1): Interpolated grid: dx=1.500 mm, dy=1.500 mm Maximum value of SAR (interpolated) = 0.197 W/kg Right Cheek High_1RB_High/Zoom Scan (7x7x7)/Cube 0: Measurement grid: dx=5mm, dy=5mm, dz=5mm Reference Value = 3.540 V/m; Power Drift = 0.15 dB Peak SAR (extrapolated) = 0.334 W/kg SAR(1 g) = 0.175 W/kg; SAR(10 g) = 0.089 W/kg Maximum value of SAR (measured) = 0.190 W/kg Fig.17 LTE Band 7 CH21350 No. I15Z41883-SEM01 Page 117 of 231 ©Copyright. All rights reserved by CTTL. Fig.17-1 Z-Scan at power reference point (Band 7 CH21350) No. I15Z41883-SEM01 Page 118 of 231 ©Copyright. All rights reserved by CTTL. LTE Band 7 Body Rear High with QPSK_20MHz_1RB_ High-AP OFF Date/Time: 2015/8/9 Electronics: DAE4 Sn786 Medium: Body 2600 Medium parameters used: f = 2560 MHz; σ = 2.050 S/m; ε r = 51.087; ρ = 1000 kg/m 3 Ambient Temperature:22.0 o C Liquid Temperature:21.5 o C Communication System: LTE_FDD Frequency: 2510 MHz Duty Cycle: 1:1 Probe: ES3DV3 - SN3151 ConvF(4.42, 4.42, 4.42); Rear side High_1RB_High /Area Scan (41x81x1): Interpolated grid: dx=1.500 mm, dy=1.500 mm Maximum value of SAR (interpolated) = 0.808 W/kg Rear side High_1RB_High/Zoom Scan (7x7x7)/Cube 0: Measurement grid: dx=5mm, dy=5mm, dz=5mm Reference Value = 5.593 V/m; Power Drift = 0.16 dB Peak SAR (extrapolated) = 1.66 W/kg SAR(1 g) = 0.645 W/kg; SAR(10 g) = 0.336 W/kg Maximum value of SAR (measured) = 0.810 W/kg Fig.18 LTE Band 7 CH21350 No. I15Z41883-SEM01 Page 119 of 231 ©Copyright. All rights reserved by CTTL. Fig.18-1 Z-Scan at power reference point (Band 7 CH21350) No. I15Z41883-SEM01 Page 120 of 231 ©Copyright. All rights reserved by CTTL. LTE Band 7 Body Bottom High with QPSK_20MHz_1RB_ High-AP ON Date/Time: 2015-8-9 Electronics: DAE4 Sn786 Medium: Body 2600 Medium parameters used: f = 2560 MHz; σ = 2.05 S/m; ε r = 51.087; ρ = 1000 kg/m 3 Ambient Temperature:22.0 o C Liquid Temperature:21.5 o C Communication System: LTE_FDD Frequency: 2510 MHz Duty Cycle: 1:1 Probe: ES3DV3 - SN3151 ConvF(4.42, 4.42, 4.42); Calibrated: 2014-9-1 LTE_Band_7 body/Bottom side High_1RB_High/Area Scan (31x51x1): Interpolated grid: dx=1.500 mm, dy=1.500 mm Maximum value of SAR (interpolated) = 0.406 W/kg LTE_Band_7 body/ Bottom side High_1RB_High/Zoom Scan (7x7x7)/Cube 0: Measurement grid: dx=5mm, dy=5mm, dz=5mm Reference Value = 13.591 V/m; Power Drift = -0.03 dB Peak SAR (extrapolated) = 0.725 W/kg SAR(1 g) = 0.370 W/kg; SAR(10 g) = 0.187 W/kg Maximum value of SAR (measured) = 0.425 W/kg Fig.19 LTE Band 7 CH21350 No. I15Z41883-SEM01 Page 121 of 231 ©Copyright. All rights reserved by CTTL. Fig.19-1 Z-Scan at power reference point (Band 7 CH21350) No. I15Z41883-SEM01 Page 122 of 231 ©Copyright. All rights reserved by CTTL. LTE Band 12 Right Cheek High with QPSK_10MHz_1RB_ High Date/Time: 2015/7/25 Electronics: DAE4 Sn786 Medium: Head 750 MHz Medium parameters used (interpolated): f = 711 MHz; σ = 0.777 S/m; ε r = 42.648; ρ = 1000 kg/m 3 Ambient Temperature:23.3 o C Liquid Temperature: 22.5 o C Communication System: UID 0, LTE Band12 (10M) (0) Frequency: 711 MHz Duty Cycle: 1:1 Probe: EX3DV4 - SN3617 ConvF(10.02, 10.02, 10.02); Area Scan (71x121x1): Interpolated grid: dx=1.500 mm, dy=1.500 mm Maximum value of SAR (interpolated) = 0.194 W/kg Zoom Scan (7x7x7)/Cube 0: Measurement grid: dx=5mm, dy=5mm, dz=5mm Reference Value = 6.…

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No. I15Z41883-SEM01 Page 170 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 171 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 172 of 231 ©Copyright. All rights reserved by CTTL. Probe ES3DV3-SN:3151 Calibration Certificate No. I15Z41883-SEM01 Page 173 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 174 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 175 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 176 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 177 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 178 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 179 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 180 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 181 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 182 of 231 ©Copyright. All rights reserved by CTTL.

No. I15Z41883-SEM01 Page 183 of 231 ©Copyright. All rights reserved by CTTL. ANNEX I DIPOLE CALIBRATION CERTIFICATE 750 MHz Dipole Calibration Certificate No. I15Z41883-SEM01 Page 184 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 185 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 186 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 187 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 188 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 189 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 190 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 191 of 231 ©Copyright. All rights reserved by CTTL. 835 MHz Dipole Calibration Certificate No. I15Z41883-SEM01 Page 192 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 193 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 194 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 195 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 196 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 197 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 198 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 199 of 231 ©Copyright. All rights reserved by CTTL. 1800 MHz Dipole Calibration Certificate No. I15Z41883-SEM01 Page 200 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 201 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 202 of 231 ©Copyright. All rights reserved by CTTL.

No. I15Z41883-SEM01 Page 203 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 204 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 205 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 206 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 207 of 231 ©Copyright. All rights reserved by CTTL. 1900 MHz Dipole Calibration Certificate No. I15Z41883-SEM01 Page 208 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 209 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 210 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 211 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 212 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 213 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 214 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 215 of 231 ©Copyright. All rights reserved by CTTL. 2450 MHz Dipole Calibration Certificate No. I15Z41883-SEM01 Page 216 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 217 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 218 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 219 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 220 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 221 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 222 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 223 of 231 ©Copyright. All rights reserved by CTTL. 2550 MHz Dipole Calibration Certificate No. I15Z41883-SEM01 Page 224 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 225 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 226 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 227 of 231 ©Copyright. All rights reserved by CTTL.

No. I15Z41883-SEM01 Page 228 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 229 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 230 of 231 ©Copyright. All rights reserved by CTTL. No. I15Z41883-SEM01 Page 231 of 231 ©Copyright. All rights reserved by CTTL. ANNEX J Accreditation Certificate

FCC&IC RF Test Report Product Name: Smart Phone Model Number: HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 FCC ID：QISSCL-L04 IC: 6369A-SCLL04 Reliability Laboratory of Huawei Technologies Co., Ltd. Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C Tel: +86 755 28780808 Fax: +86 755 89652518 Notice RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 2 of 16 1. The laboratory has Passed the accreditation by China National Accreditation Service for Conformity Assessment (CNAS). The accreditation number is L0310. 2. The laboratory has Passed the accreditation by The American Association for Laboratory Accreditation (A2LA). The accreditation number is 2174.01. 3. The laboratory has been listed by the US Federal Communications Commission to perform electromagnetic emission measurements. The site recognition number is 97456. 4. The laboratory has been listed by Industry Canada to perform electromagnetic emission measurements. The recognition numbers of test site are 6369A-2. 5. The test report is invalid if not marked with the signatures of the persons responsible for preparing and approving the test report. 6. The test report is invalid if there is any evidence of erasure and/or falsification. 7. The test report is only valid for the test samples. 8. Content of the test report, in part or in full, cannot be used for publicity and/or promotional purposes without prior written approval from the laboratory. RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 3 of 16 Applicant: Huawei Technologies Co., Ltd. Address: Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C Date of Receipt Sample: 2015-07-20 Start Date of Test: 2015-07-20 End Date of Test: 2015-08-03 Test Result: Pass Approved by Senior Engineer: 2015-08-18 Liu Chunlin Date Name Signature Prepared by: 2015-08-18 Wu Tingsi Date Name Signature RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 4 of 16 Modification Record No. Last Report No. Modification Description 1 First report. RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 5 of 16 CONTENT 1 General Information ................................................................................................................................................ 6 1.1 Applied Standard........................................................................................................................................ 6 1.2 Test Location ............................................................................................................................................. 6 1.3 Test Environment Condition ....................................................................................................................... 6 2 Test Summary ........................................................................................................................................................ 7 3 Description of the Equipment under Test (EUT) ..................................................................................................... 8 3.1 General Description ................................................................................................................................... 8 3.2 EUT Identity ............................................................................................................................................... 8 3.3 Technical Description ................................................................................................................................. 9 4 General Test Conditions / Configurations ............................................................................................................. 10 4.1 EUT Configurations .................................................................................................................................. 10 4.2 Test Environments ................................................................................................................................... 10 4.3 Test Setups .............................................................................................................................................. 11 4.4 Test Conditions ........................................................................................................................................ 14 5 Main Test Instruments .......................................................................................................................................... 15 RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 6 of 16 1 General Information 1.1 Applied Standard Applied Rules: 47 CFR FCC Part 2, Subpart J 2014 47 CFR FCC Part 15, Subpart C 2014 IC RSS-Gen (Issue 4, November 2014) IC RSS-210 (Issue 8, December 2010) Test Method: FCC KDB 558074 D01 DTS Meas Guidance v03r02 ANSI C63.10-2013, American National Standard for Testing Unlicensed Wireless Devices. 1.2 Test Location Test Location 1: Reliability Laboratory of Huawei Technologies Co., Ltd. Address: Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C Test Location 2: Address : BTL Laboratory No.3,Jinshagang 1st Road,ShiXia,Dalang Town,DongGuan,China. 1.3 Test Environment Condition Ambient Temperature: 19.5to 25 °C Ambient Relative Humidity: 40 to 55 % Atmospheric Pressure: Not app…

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RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 1 of 50 Appendix for Testreport RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 2 of 50 Appendix A: DTS (6 dB) Bandwidth In this document, the "DTS6dBBW" refers to the measured "DTS (6 dB) Bandwidth" value. In this Appendix, the "fc(DTS6dBBW)" refers to the centre of the measured "DTS6dBBW". The introduction of the "fc(DTS6dBBW)" is due to that other measurements use it as the spectrum analyzer setting. For measurements on smart antenna systems (devices with multiple transmit chains), the test is performed at each chain, and used as respective results for each chain. Part I - Test Results Test Mode Test Channel Frequency[MHz] Ant DTS6dBBW[MHz] Verdict TM1 _Ch0 L 2402 Ant 1 0.68 pass TM1_Ch19 M 2440 Ant 1 0.68 pass TM1_Ch39 H 2480 Ant 1 0.68 pass RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 3 of 50 Part II - Test Plots 2.1 TM1_Ch0_L RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 4 of 50 2.3 TM1_Ch19_M RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 5 of 50 2.5 TM1_Ch19_H RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 6 of 50 Appendix B: Occupied Bandwidth For measurements on smart antenna systems (devices with multiple transmit chains), the test is performed at each chain, and used as respective results for each chain. Part I - Test Results Test Mode Test Channel Frequency[MHz] Ant Occupied Bandwidth [MHz] Verdict TM1 _Ch0 L 2402 Ant 1 1.07 pass TM1_Ch19 M 2440 Ant 1 1.07 pass TM1_Ch39 H 2480 Ant 1 1.07 pass RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 7 of 50 Part II - Test Plots 2.1 TM1_Ch0_L RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 8 of 50 2.1 TM1_Ch19_M RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 9 of 50 2.1 TM1_Ch19_H RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 10 of 50 Appendix C: Duty Cycle Part I - Test Results Test Mode TX Freq. [MHz] Duty cycle [%] TM1 CH0,CH19,CH39 63 Part II - Test Plots 2.1 TM1 RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 11 of 50 Appendix D: Maximum Conducted Average Output Power Part I - Test Results Test Mode Test Channel Frequency[MHz] Ant Power[dBm] Verdict TM1 _Ch0 L 2402 Ant 1 -0.47 pass TM1_Ch19 M 2440 Ant 1 1.084 pass TM1_Ch39 H 2480 Ant 1 -0.23 pass RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 12 of 50 Part II - Test Plots 2.1 TM1_Ch0_L RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 13 of 50 2.3 TM1_Ch19_M RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 14 of 50 2.5 TM1_Ch19_H RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 15 of 50 Appendix E: Maximum Power Spectral Density Level Part I - Test Results Test Mode Test Channel Frequency[MHz] Ant PD[MHz] Verdict TM1 _Ch0 L 2402 Ant 1 -14.52 pass TM1_Ch19 M 2440 Ant 1 -10.54 pass TM1_Ch39 H 2480 Ant 1 -12.42 pass RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 16 of 50 Part II - Test Plots 2.1 TM1_Ch0_L RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 17 of 50 2.3 TM1_Ch19_M RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 18 of 50 2.5 TM1_Ch19_H RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 19 of 50 Appendix F: Band Edges Compliance Part I - Test Results Test Mode Test Channel Frequency[MHz] Ant Carrier Power[dBm] Max.Spurious Level[dBm] Verdict TM1 _Ch0 L 2402 Ant 1 -.68 -49.69 pass TM1_Ch39 H 2480 Ant 1 -.42 -43.74 pass RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 20 of 50 Part II - Test Plots 2.1 TM1_Ch0_L RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 21 of 50 2.3 TM1_Ch19_H RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2004 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 22 of 50 Appendix G: Unwanted Emissions into Non-Restricted…

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FCC&IC RF Test Report Product Name: Smart Phone Model Number: HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2002 FCC ID：QISSCL-L04 IC: 6369A-SCLL04 \ Reliability Laboratory of Huawei Technologies Co., Ltd. Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C Tel: +86 755 28780808 Fax: +86 755 89652518 RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2002 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 2 of 20 Notice 1. The laboratory has Passed the accreditation by China National Accreditation Service for Conformity Assessment (CNAS). The accreditation number is L0310. 2. The laboratory has Passed the accreditation by The American Association for Laboratory Accreditation (A2LA). The accreditation number is 2174.01. 3. The laboratory has been listed by the US Federal Communications Commission to perform electromagnetic emission measurements. The site recognition number is 97456. 4. The laboratory has been listed by Industry Canada to perform electromagnetic emission measurements. The recognition numbers of test site are 6369A-1 and 6369A-3. 5. The test report is invalid if not marked with the signatures of the persons responsible for preparing and approving the test report. 6. The test report is invalid if there is any evidence of erasure and/or falsification. 7. The test report is only valid for the test samples. 8. Content of the test report, in part or in full, cannot be used for publicity and/or promotional purposes without prior written approval from the laboratory. RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2002 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 3 of 20 Date of Receipt Sample: 2015-07-20 Start Date of Test: 2015-07-20 End Date of Test: 2015-08-03 Test Result: Pass Approved by Senior Engineer: 2015-08-18 Liu Chunlin Date Name Signature Prepared by: 2015-08-18 Wu Tingsi Date Name Signature Applicant: Huawei Technologies Co., Ltd. Address: Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2002 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 4 of 20 Modification Record No. Last Report No. Modification Description First Report RF Test Report of HUAWEI SCL-L04, SCL-L04 Report No: SYBH(Z-RF)020072015-2002 Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd. Page 5 of 20 CONTENT 1 General Information ................................................................................................................................................ 6 1.1 Applied Standard........................................................................................................................................ 6 1.2 Test Location ............................................................................................................................................. 6 1.3 Test Environment Condition ....................................................................................................................... 6 2 Test Summary ........................................................................................................................................................ 7 3 Description of the Equipment under Test (EUT) ..................................................................................................... 8 3.1 General Description ..............…

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